K4S1G0632D-UC75
Samsung Semiconductor, Inc.
- Lifecycle statusDiscontinued
- RoHSRoHS compliant
- REACHREACH compliant
- DescriptionCache DRAM Module, 256MX4, 5.4ns, CMOS, PDSO54
- Category
- ECCNEAR99
- ECCN GovernanceEAR
- HTS Code8542.32.00.32
- SB Code8542.32.00.15
- I/O TypeCOMMON
- TechnologyCMOS
- JESD-30 CodeR-PDSO-G54
- Memory Width4
- Organization256MX4
- Package CodeSSOP
- JESD-609 Codee3
- Package ShapeRECTANGULAR
- Package StyleSMALL OUTLINE, SHRINK PITCH Meter
- Surface MountYES
- Terminal FormGULL WING
- Memory Density1073741824 bit
- Memory IC TypeCACHE DRAM MODULE
- Refresh Cycles8192
- Terminal Pitch0.8 mm
- Access Time-Max5.4 ns
- Number of Words268435456 words
- Terminal FinishMATTE TIN
- Temperature GradeCOMMERCIAL
- Terminal PositionDUAL
- Supply Current-Max230 mA
- Number of Terminals54
- Standby Current-Max0.004 Amp
- Number of Words Code256M
- Qualification StatusNot Qualified
- Package Body MaterialPLASTIC/EPOXY
- Output Characteristics3-STATE
- Sequential Burst Length1,2,4,8
- Interleaved Burst Length1,2,4,8
- Package Equivalence CodeSOP54,.46,32
- Operating Temperature-Max70 Cel
- Operating Temperature-Min0 Cel
- Supply Voltage-Nom (Vsup)3.3 V
- Clock Frequency-Max (fCLK)133 MHz
- Moisture Sensitivity Level1
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K4S1G0632D-UC75