K4B2G1646B-HIH9
Samsung Semiconductor, Inc.
- Lifecycle statusDiscontinued
- RoHSRoHS compliant
- REACHREACH compliant
- DescriptionCache DRAM Module, 128MX16, 0.255ns, CMOS, PBGA96
- Category
- ECCNEAR99
- ECCN GovernanceEAR
- HTS Code8542.32.00.36
- SB Code8542.32.00.23
- I/O TypeCOMMON
- TechnologyCMOS
- JESD-30 CodeR-PBGA-B96
- Memory Width16
- Organization128MX16
- Package CodeFBGA
- JESD-609 Codee3
- Package ShapeRECTANGULAR
- Package StyleGRID ARRAY, FINE PITCH Meter
- Surface MountYES
- Terminal FormBALL
- Memory Density2147483648 bit
- Memory IC TypeCACHE DRAM MODULE
- Refresh Cycles8192
- Terminal Pitch0.8 mm
- Access Time-Max0.255 ns
- Number of Words134217728 words
- Terminal FinishMATTE TIN
- Temperature GradeINDUSTRIAL
- Terminal PositionBOTTOM
- Supply Current-Max300 mA
- Number of Terminals96
- Standby Current-Max0.012 Amp
- Number of Words Code128M
- Qualification StatusNot Qualified
- Package Body MaterialPLASTIC/EPOXY
- Output Characteristics3-STATE
- Sequential Burst Length8
- Interleaved Burst Length8
- Package Equivalence CodeBGA96,9X16,32
- Operating Temperature-Max95 Cel
- Operating Temperature-Min-40 Cel
- Supply Voltage-Nom (Vsup)1.5 V
- Clock Frequency-Max (fCLK)667 MHz
- Moisture Sensitivity Level1
- Peak Reflow Temperature (Cel)260
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K4B2G1646B-HIH9