SN74LVT18512DGGR
Texas Instruments Incorporated
- Lifecycle statusActive
- RoHSRoHS compliant
- REACHREACH compliant
- Description3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers 64-TSSOP -40 to 85
- Category
- ECCNEAR99
- ECCN GovernanceEAR
- HTS Code8542.39.00.01
- SB Code8542.39.00.00
- CPU FamilyLVT
- TechnologyCMOS
- Width (mm)6.1
- Length (mm)17
- JESD-30 CodeR-PDSO-G64
- Package CodeTSSOP
- Package ShapeRECTANGULAR
- Package StyleSMALL OUTLINE, THIN PROFILE, SHRINK PITCH Meter
- Surface MountYES
- Terminal FormGULL WING
- J-STD-609 Codee4
- Terminal FinishNICKEL PALLADIUM GOLD
- DLA QualificationNot Qualified
- Temperature GradeINDUSTRIAL
- Terminal PositionDUAL
- Number of Terminals64
- Terminal Pitch (mm)0.5
- Package Body MaterialPLASTIC/EPOXY
- Seated Height-Max (mm)1.2
- Supply Voltage-Max (V)3.6
- Supply Voltage-Min (V)2.7
- Supply Voltage-Nom (V)3.3
- External Data Bus Width0
- Supply Current-Max (mA)24
- Moisture Sensitivity Level1
- uPs/uCs/Peripheral ICs TypeMICROPROCESSOR CIRCUIT
- Peak Reflow Temperature (Cel)260
- Operating Temperature-Max (Cel)85
- Operating Temperature-Min (Cel)-40
- Time@Peak Reflow Temperature-Max (s)30
0 suppliers available to buy or to bid for SN74LVT18512DGGR
Send an RFQ
Send an RFQ
Negotiated savings, bought with a click.
Send an RFQ
SN74LVT18512DGGR